{"id":2669,"date":"2026-07-16T01:59:36","date_gmt":"2026-07-16T01:59:36","guid":{"rendered":"https:\/\/www.sapphire-windows.com\/?p=2669"},"modified":"2026-07-16T02:00:53","modified_gmt":"2026-07-16T02:00:53","slug":"surface-quality-standards-for-sapphire-windows-scratch-dig-flatness-and-parallelism-explained","status":"publish","type":"post","link":"https:\/\/www.sapphire-windows.com\/de\/surface-quality-standards-for-sapphire-windows-scratch-dig-flatness-and-parallelism-explained\/","title":{"rendered":"Oberfl\u00e4chenqualit\u00e4tsstandards f\u00fcr Saphirfenster: Erl\u00e4uterung zu Kratz- und Einstechfehlern, Ebenheit und Parallelit\u00e4t"},"content":{"rendered":"<p class=\"wp-block-paragraph\"><a href=\"https:\/\/www.sapphire-windows.com\/de\/product-category\/saphirfenster\/\" data-type=\"link\" data-id=\"https:\/\/www.sapphire-windows.com\/product-category\/sapphire-windows\/\">Saphir-Fenster<\/a> Sie finden breite Anwendung in optischen Instrumenten, Anlagen zur Halbleiterfertigung, Hochdruck-Sichtfenstern, Infrarotsystemen, Schutzabdeckungen f\u00fcr Sensoren und Bildgebungssystemen f\u00fcr raue Umgebungsbedingungen. Ihre Beliebtheit beruht auf der hohen H\u00e4rte, der mechanischen Festigkeit, der chemischen Best\u00e4ndigkeit und dem breiten optischen Durchl\u00e4ssigkeitsbereich von Saphir.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Die Leistungsf\u00e4higkeit eines Saphirfensters h\u00e4ngt jedoch nicht allein vom Material ab. Zwei Fenster aus derselben Saphirg\u00fcte und mit denselben Abmessungen k\u00f6nnen sehr unterschiedliche Eigenschaften aufweisen, wenn ihre Anforderungen an Oberfl\u00e4chenqualit\u00e4t, Ebenheit oder Parallelit\u00e4t voneinander abweichen.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">F\u00fcr Ingenieure und Beschaffungsteams sind drei Parameter besonders wichtig:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Kratzgraben<\/li>\n\n\n\n<li>Ebenheit der Oberfl\u00e4che<\/li>\n\n\n\n<li>Parallelit\u00e4t<\/li>\n<\/ul>\n\n\n\n<p class=\"wp-block-paragraph\">Diese Parameter beschreiben verschiedene Aspekte der optischen Qualit\u00e4t. Die Pr\u00fcfung auf Kratzer und Vertiefungen dient der Kontrolle lokaler optischer M\u00e4ngel, die Ebenheitspr\u00fcfung dient der Kontrolle der Gesamtform einer optischen Oberfl\u00e4che und die Parallelit\u00e4tspr\u00fcfung dient der Kontrolle des Winkelverh\u00e4ltnisses zwischen den beiden Hauptfl\u00e4chen.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Das Verst\u00e4ndnis der Unterschiede zwischen diesen Materialien ist von entscheidender Bedeutung, wenn Saphirfenster f\u00fcr Anwendungen in den Bereichen Bildgebung, Lasertechnik, Sensorik, Vakuumtechnik, Halbleitertechnik und Pr\u00e4zisionsoptik ausgew\u00e4hlt werden.<\/p>\n\n\n\n<figure class=\"wp-block-image aligncenter size-large\"><img fetchpriority=\"high\" decoding=\"async\" width=\"1024\" height=\"683\" src=\"https:\/\/www.sapphire-windows.com\/wp-content\/uploads\/2026\/07\/Surface-Quality-Standards-for-Sapphire-Windows-Scratch-Dig-Flatness-and-Parallelism-Explained-1024x683.png\" alt=\"\" class=\"wp-image-2670\" srcset=\"https:\/\/www.sapphire-windows.com\/wp-content\/uploads\/2026\/07\/Surface-Quality-Standards-for-Sapphire-Windows-Scratch-Dig-Flatness-and-Parallelism-Explained-1024x683.png 1024w, https:\/\/www.sapphire-windows.com\/wp-content\/uploads\/2026\/07\/Surface-Quality-Standards-for-Sapphire-Windows-Scratch-Dig-Flatness-and-Parallelism-Explained-300x200.png 300w, https:\/\/www.sapphire-windows.com\/wp-content\/uploads\/2026\/07\/Surface-Quality-Standards-for-Sapphire-Windows-Scratch-Dig-Flatness-and-Parallelism-Explained-768x512.png 768w, https:\/\/www.sapphire-windows.com\/wp-content\/uploads\/2026\/07\/Surface-Quality-Standards-for-Sapphire-Windows-Scratch-Dig-Flatness-and-Parallelism-Explained-18x12.png 18w, https:\/\/www.sapphire-windows.com\/wp-content\/uploads\/2026\/07\/Surface-Quality-Standards-for-Sapphire-Windows-Scratch-Dig-Flatness-and-Parallelism-Explained-600x400.png 600w, https:\/\/www.sapphire-windows.com\/wp-content\/uploads\/2026\/07\/Surface-Quality-Standards-for-Sapphire-Windows-Scratch-Dig-Flatness-and-Parallelism-Explained.png 1536w\" sizes=\"(max-width: 1024px) 100vw, 1024px\" \/><\/figure>\n\n\n\n<h2 class=\"wp-block-heading\">1. Warum die Oberfl\u00e4chenqualit\u00e4t bei Saphirfenstern eine Rolle spielt<\/h2>\n\n\n\n<p class=\"wp-block-paragraph\">Ein Saphirfenster erf\u00fcllt in der Regel zwei Funktionen. Erstens bietet es mechanischen Schutz und Schutz vor Umwelteinfl\u00fcssen. Zweitens l\u00e4sst es Licht mit einem akzeptablen Ma\u00df an Verzerrung, Streuung und Reflexion durch.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Oberfl\u00e4chenfehler oder geometrische Abweichungen k\u00f6nnen sich negativ auf beide Funktionen auswirken.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Kratzer und Vertiefungen k\u00f6nnen das Licht streuen, Streulicht verst\u00e4rken und die optische Qualit\u00e4t des Bauteils beeintr\u00e4chtigen. Eine schlechte Ebenheit kann die durchgelassene Wellenfront verzerren. Eine unzureichende Parallelit\u00e4t kann zu Strahlabweichungen, Bildverschiebungen oder unerw\u00fcnschten Interferenzeffekten f\u00fchren.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Diese Probleme gewinnen bei Anwendungen an Bedeutung, bei denen es um Folgendes geht:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Koh\u00e4rente Laserstrahlen<\/li>\n\n\n\n<li>Hochaufl\u00f6sende Bildgebung<\/li>\n\n\n\n<li>Interferometrische Messung<\/li>\n\n\n\n<li>Enge optische Felder<\/li>\n\n\n\n<li>Hochleistungsbeleuchtung<\/li>\n\n\n\n<li>Pr\u00e4zisionsausrichtung<\/li>\n\n\n\n<li>Mehrere optische Oberfl\u00e4chen<\/li>\n\n\n\n<li>Systeme mit hoher numerischer Apertur<\/li>\n<\/ul>\n\n\n\n<p class=\"wp-block-paragraph\">Eine Schutzabdeckung aus Saphir f\u00fcr eine Industriekamera muss m\u00f6glicherweise nicht dieselbe optische Qualit\u00e4t aufweisen wie ein Saphirfenster, das in einem Interferometer oder einem Laserresonator verwendet wird. Daher sollten die Oberfl\u00e4chenanforderungen stets entsprechend der tats\u00e4chlichen Funktion des Fensters ausgew\u00e4hlt werden.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\">2. Scratch-Dig: Bewertung lokaler Oberfl\u00e4chenfehler<\/h2>\n\n\n\n<p class=\"wp-block-paragraph\">Das \u201eScratch-Dig\u201c-Verfahren ist eine der am h\u00e4ufigsten verwendeten Methoden zur Bestimmung der sichtbaren Oberfl\u00e4chenqualit\u00e4t optischer Komponenten.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Der Begriff bezeichnet zwei Kategorien lokaler Defekte:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li><strong>Kratzer:<\/strong> l\u00e4ngliche Fehler oder Flecken auf der polierten Oberfl\u00e4che<\/li>\n\n\n\n<li><strong>Digs:<\/strong> lokalisierte Vertiefungen, Nadell\u00f6cher, Blasen, Einschl\u00fcsse oder kleine kreisf\u00f6rmige Defekte<\/li>\n<\/ul>\n\n\n\n<p class=\"wp-block-paragraph\">Die Kratz- und Grabungspr\u00fcfung wird \u00fcblicherweise mit dem in MIL-PRF-13830 beschriebenen, auf Vergleichen basierenden System in Verbindung gebracht. Diese Spezifikation regelt die Herstellung und Pr\u00fcfung fertiger optischer Komponenten, darunter Fenster, Linsen, Prismen und Spiegel.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Die Norm ISO 10110-7 bietet ein weiteres international anerkanntes System zur Festlegung zul\u00e4ssiger Oberfl\u00e4chenfehler innerhalb eines definierten Pr\u00fcfbereichs. Sie umfasst lokale Fehler, Kantenabsplitterungen und lange Kratzer an einzelnen optischen Elementen und Baugruppen.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Es ist wichtig zu beachten, dass die MIL-Konvention zur Kennzeichnung von Kratzern und Vertiefungen und die ISO-Konvention zur Kennzeichnung von Oberfl\u00e4chenfehlern keine identischen Systeme sind. In einer Zeichnung oder einer Bestellung sollte daher angegeben werden, welche Norm und welche Pr\u00fcfmethode gelten.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\">3. Wie man eine \u201eScratch-Dig\u201c-Spezifikation liest<\/h2>\n\n\n\n<p class=\"wp-block-paragraph\">Eine typische \u201eScratch-Dig\u201c-Anforderung l\u00e4sst sich wie folgt formulieren:<\/p>\n\n\n\n<p class=\"wp-block-paragraph\"><strong>60-40<\/strong><\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Die erste Zahl bezieht sich auf die zul\u00e4ssige Kratzmarkierung, w\u00e4hrend die zweite Zahl die zul\u00e4ssige Grabmarkierung angibt.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Zu den g\u00e4ngigen Spezifikationen geh\u00f6ren:<\/p>\n\n\n\n<figure class=\"wp-block-table\"><table class=\"has-fixed-layout\"><tbody><tr><th>Kratz-Grab-Klasse<\/th><th>Allgemeines Qualit\u00e4tsniveau<\/th><th>Typische Anwendungen<\/th><\/tr><tr><td>80-50<\/td><td>Professionelle Qualit\u00e4t<\/td><td>Schutzabdeckungen, allgemeine Sichtfenster<\/td><\/tr><tr><td>60-40<\/td><td>Standard-Optikqualit\u00e4t<\/td><td>Industrieoptik, Sensoren, Bildverarbeitung im Allgemeinen<\/td><\/tr><tr><td>40-20<\/td><td>Pr\u00e4zise optische Qualit\u00e4t<\/td><td>Wissenschaftliche Instrumente, Bildgebung mit h\u00f6herer Aufl\u00f6sung<\/td><\/tr><tr><td>20-10<\/td><td>Hochpr\u00e4zise Qualit\u00e4t<\/td><td>Lasersysteme, Interferometrie, anspruchsvolle Bildgebung<\/td><\/tr><tr><td>10-5<\/td><td>Sehr hohe optische Qualit\u00e4t<\/td><td>Spezialisierte Laser- und Messtechnik-Systeme<\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\n<p class=\"wp-block-paragraph\">Eine kleinere Zahl deutet in der Regel auf eine strengere Anforderung an die Oberfl\u00e4chenqualit\u00e4t hin.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Diese Werte sollten jedoch nicht automatisch als die genaue physikalische Breite und der genaue Durchmesser jedes Defekts interpretiert werden. Beim herk\u00f6mmlichen, auf Vergleichen basierenden \u201eScratch-Dig\u201c-Verfahren werden Kratzer in erster Linie durch den Vergleich mit Referenzstandards unter kontrollierten Beleuchtungs- und Beobachtungsbedingungen bewertet.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Daher handelt es sich bei der Kratz-Grabe-Pr\u00fcfung teilweise eher um ein visuelles oder vergleichendes Verfahren als um eine direkte Messung der Oberfl\u00e4chenrauheit.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\">4. Kratzspuren sind nicht dasselbe wie Oberfl\u00e4chenrauheit<\/h2>\n\n\n\n<p class=\"wp-block-paragraph\">Kratzspuren und Oberfl\u00e4chenrauheit werden h\u00e4ufig verwechselt, beschreiben jedoch unterschiedliche Oberfl\u00e4cheneigenschaften.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Mit \u201eScratch-Dig\u201c lassen sich isolierte Defekte wie beispielsweise folgende bewerten:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Kratzer polieren<\/li>\n\n\n\n<li>Handhabungszeichen<\/li>\n\n\n\n<li>Kleine Vertiefungen<\/li>\n\n\n\n<li>Kantenbedingte Unregelm\u00e4\u00dfigkeiten<\/li>\n\n\n\n<li>Beschichtungsfehler<\/li>\n\n\n\n<li>Lokalisierte Einschl\u00fcsse<\/li>\n<\/ul>\n\n\n\n<p class=\"wp-block-paragraph\">Die Oberfl\u00e4chenrauheit beschreibt mikroskopisch kleine, dicht beieinander liegende Abweichungen auf der polierten Oberfl\u00e4che. Sie wird in der Regel anhand folgender Parameter ausgedr\u00fcckt:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Ra<\/li>\n\n\n\n<li>Rq<\/li>\n\n\n\n<li>RMS-Rauheit<\/li>\n<\/ul>\n\n\n\n<p class=\"wp-block-paragraph\">Ein Saphirfenster kann eine geringe Oberfl\u00e4chenrauheit aufweisen und dennoch einen sichtbaren Kratzer enthalten. Umgekehrt kann eine Oberfl\u00e4che zwar frei von gro\u00dfen Kratzern erscheinen, aber dennoch eine mikroskopische Rauheit aufweisen, die die optische Streuung verst\u00e4rkt.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Bei Laser-, Ultraviolett- und kurzwelligen Anwendungen m\u00fcssen unter Umst\u00e4nden sowohl Kratzer als auch die Oberfl\u00e4chenrauheit kontrolliert werden.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\">5. Wie sich Kratzer und Vertiefungen auf die optische Leistung auswirken<\/h2>\n\n\n\n<p class=\"wp-block-paragraph\">Oberfl\u00e4chenfehler k\u00f6nnen durch Streuung, Beugung und lokale Reflexion mit dem einfallenden Licht in Wechselwirkung treten.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Bei herk\u00f6mmlichen Bildgebungsanwendungen haben eine geringe Anzahl kleiner Oberfl\u00e4chenfehler m\u00f6glicherweise kaum messbare Auswirkungen auf die Bildqualit\u00e4t. Dennoch k\u00f6nnen sie an Bedeutung gewinnen, wenn das optische System ein geringes Streulicht oder einen hohen Kontrast erfordert.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">In Lasersystemen k\u00f6nnen lokale Defekte von gr\u00f6\u00dferer Bedeutung sein, da sie:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Koh\u00e4rentes Licht streuen<\/li>\n\n\n\n<li>Unerw\u00fcnschte Beugungsmuster erzeugen<\/li>\n\n\n\n<li>Hintergrundger\u00e4usche verst\u00e4rken<\/li>\n\n\n\n<li>Lokale Absorptionsstellen schaffen<\/li>\n\n\n\n<li>Die Laserbest\u00e4ndigkeit beschichteter Oberfl\u00e4chen verringern<\/li>\n\n\n\n<li>Beitrag zur Erw\u00e4rmung bei hoher optischer Leistung<\/li>\n<\/ul>\n\n\n\n<p class=\"wp-block-paragraph\">Der tats\u00e4chliche Effekt h\u00e4ngt von der Defektgr\u00f6\u00dfe, der Lage des Defekts, der Wellenl\u00e4nge der Beleuchtung, der optischen Leistung und der Position des Fensters innerhalb des Systems ab.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Ein Fehler am Rand der freien Apertur ist m\u00f6glicherweise weniger gravierend als derselbe Fehler in der Mitte des Strahlengangs. Aus diesem Grund sollte in den Zeichnungen die freie Apertur oder der effektive Pr\u00fcfbereich definiert werden, anstatt die gleiche Anforderung unterschiedslos auf die gesamte physikalische Oberfl\u00e4che anzuwenden.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\">6. Oberfl\u00e4chenebenheit: Steuerung der Fensterform<\/h2>\n\n\n\n<p class=\"wp-block-paragraph\">Die Ebenheit beschreibt, wie stark eine optische Oberfl\u00e4che von einer idealen Ebene abweicht.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Selbst wenn ein Saphirfenster dem Auge flach erscheint, kann seine Oberfl\u00e4che geringe Mengen an folgenden Stoffen enthalten:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Kr\u00fcmmung<\/li>\n\n\n\n<li>Bogen<\/li>\n\n\n\n<li>Leistung<\/li>\n\n\n\n<li>Unregelm\u00e4\u00dfigkeit<\/li>\n\n\n\n<li>Kantenabfall<\/li>\n\n\n\n<li>Lokale Welligkeit<\/li>\n<\/ul>\n\n\n\n<p class=\"wp-block-paragraph\">Die Norm ISO 10110-5 legt Regeln f\u00fcr die Angabe zul\u00e4ssiger Abweichungen der Oberfl\u00e4chenform in optischen Zeichnungen fest. Das aktuelle ISO-Rahmenwerk erlaubt es, Toleranzen der Oberfl\u00e4chenform in physikalischen Einheiten wie Nanometern anzugeben; zudem k\u00f6nnen auf Interferenzstreifen basierende Angaben verwendet werden, sofern die Referenzwellenl\u00e4nge eindeutig angegeben ist.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Die Ebenheit wird h\u00e4ufig in Bruchteilen oder Vielfachen einer Wellenl\u00e4nge angegeben, zum Beispiel:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>2\u03bb<\/li>\n\n\n\n<li>1\u03bb<\/li>\n\n\n\n<li>\u03bb\/2<\/li>\n\n\n\n<li>\u03bb\/4<\/li>\n\n\n\n<li>\u03bb\/10<\/li>\n<\/ul>\n\n\n\n<p class=\"wp-block-paragraph\">Die Wellenl\u00e4nge wird \u00fcblicherweise auf die Wellenl\u00e4nge eines Helium-Neon-Lasers von etwa 632,8 nm bezogen, doch muss dies ausdr\u00fccklich angegeben werden, da die durch eine Wellenl\u00e4ngenangabe dargestellte physikalische Abweichung von der Testwellenl\u00e4nge abh\u00e4ngt.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Beispielsweise stellt eine Ebenheitsspezifikation von \u03bb\/4 bei 632,8 nm eine strengere physikalische Toleranz dar als \u03bb\/2 bei derselben Wellenl\u00e4nge.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\">7. Was bedeutet \u201e\u03bb\/4-Ebenheit\u201c eigentlich?<\/h2>\n\n\n\n<p class=\"wp-block-paragraph\">Wenn die Ebenheit mit \u03bb\/4 angegeben wird, muss die Interpretation im Zusammenhang mit dem Messaufbau gesehen werden und es muss ber\u00fccksichtigt werden, ob sich der Wert auf die Oberfl\u00e4chenabweichung oder die Abweichung der reflektierten Wellenfront bezieht.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Bei einer reflektierenden Messung kann die optische Wegdifferenz etwa doppelt so gro\u00df sein wie der physikalische Oberfl\u00e4chenh\u00f6henfehler, da das Licht zur Oberfl\u00e4che und wieder zur\u00fcck wandert. Diese Unterscheidung kann zu Verwirrung f\u00fchren, wenn Spezifikationen zwischen Konstrukteuren, Lieferanten und Pr\u00fcfabteilungen ausgetauscht werden.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Daher sollte eine Anforderung an die vollst\u00e4ndige Ebenheit im Idealfall Folgendes umfassen:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Der zul\u00e4ssige Ebenheitswert<\/li>\n\n\n\n<li>Die Referenzwellenl\u00e4nge<\/li>\n\n\n\n<li>Die Mess\u00f6ffnung<\/li>\n\n\n\n<li>Ob sich der Wert auf die Oberfl\u00e4chenform oder den Wellenfrontfehler bezieht<\/li>\n\n\n\n<li>Die Bewertungsmethode<\/li>\n\n\n\n<li>Jede ausgeschlossene Randzone<\/li>\n<\/ul>\n\n\n\n<p class=\"wp-block-paragraph\">Ohne diese Angaben k\u00f6nnten zwei Pr\u00fcfteams dieselbe \u03bb-basierte Anforderung unterschiedlich auslegen.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\">8. How Sapphire Window Flatness Is Measured<\/h2>\n\n\n\n<p class=\"wp-block-paragraph\">Flatness is commonly measured using optical interferometry.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">In a typical test, the sapphire surface is compared with a calibrated reference flat. When monochromatic light reflects from the test surface and reference surface, interference fringes are formed.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">The shape and spacing of these fringes indicate the difference between the surfaces.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Straight, evenly spaced fringes generally indicate a relatively uniform difference in angle or spacing. Curved or irregular fringes indicate surface-form errors.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">NIST describes optical-flat calibration methods based on direct interferometric comparison with a master flat and absolute three-flat methods. These techniques demonstrate why the accuracy of the reference surface, support condition and measurement setup is important in precision flatness inspection.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Modern phase-shifting interferometers can generate a full surface map and calculate values such as:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Abweichung zwischen Spitzen- und Talwert<\/li>\n\n\n\n<li>RMS-Oberfl\u00e4chenfehler<\/li>\n\n\n\n<li>Leistung<\/li>\n\n\n\n<li>Unregelm\u00e4\u00dfigkeit<\/li>\n\n\n\n<li>Astigmatismus<\/li>\n\n\n\n<li>Lokale Oberfl\u00e4chenverformung<\/li>\n<\/ul>\n\n\n\n<p class=\"wp-block-paragraph\">For transparent sapphire windows, measurement can be complicated by reflections from both the front and rear surfaces. Appropriate measurement geometry, surface separation, wavelength selection or data-processing methods may be required to isolate the surface being tested.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\">9. Factors That Influence Flatness Measurement<\/h2>\n\n\n\n<p class=\"wp-block-paragraph\">Flatness is not only a manufacturing property. It can also be influenced by the inspection environment.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Important factors include:<\/p>\n\n\n\n<h3 class=\"wp-block-heading\">Support Method<\/h3>\n\n\n\n<p class=\"wp-block-paragraph\">A thin sapphire window may deform under its own weight or due to clamping pressure. Measuring it on a rigid fixture may produce a different result from measuring it in a free or lightly supported condition.<\/p>\n\n\n\n<h3 class=\"wp-block-heading\">Temperatur<\/h3>\n\n\n\n<p class=\"wp-block-paragraph\">Temperature gradients can cause temporary deformation. Sapphire also has anisotropic material properties, meaning some physical characteristics depend on crystallographic orientation.<\/p>\n\n\n\n<h3 class=\"wp-block-heading\">Surface Cleanliness<\/h3>\n\n\n\n<p class=\"wp-block-paragraph\">Dust, oil, fingerprints or particles between the window and test fixture may affect the interference pattern.<\/p>\n\n\n\n<h3 class=\"wp-block-heading\">Blende l\u00f6schen<\/h3>\n\n\n\n<p class=\"wp-block-paragraph\">The edge region is often more difficult to polish and may contain roll-off. A flatness result across the full diameter may therefore differ significantly from a result measured only over the optical clear aperture.<\/p>\n\n\n\n<h3 class=\"wp-block-heading\">Coating Stress<\/h3>\n\n\n\n<p class=\"wp-block-paragraph\">Anti-reflection or other functional coatings may introduce stress that changes the final surface form, particularly on thin windows.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">For demanding applications, flatness should be verified after all major manufacturing operations, including coating when applicable.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\">10. How Flatness Affects Optical Performance<\/h2>\n\n\n\n<p class=\"wp-block-paragraph\">A window with poor flatness behaves like a weak lens or distorted optical element.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Instead of passing through without modification, the transmitted wavefront may acquire:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Defocus<\/li>\n\n\n\n<li>Astigmatismus<\/li>\n\n\n\n<li>Higher-order aberrations<\/li>\n\n\n\n<li>Local wavefront distortion<\/li>\n\n\n\n<li>Image blur<\/li>\n\n\n\n<li>Phase non-uniformity<\/li>\n<\/ul>\n\n\n\n<p class=\"wp-block-paragraph\">The transmitted wavefront error depends on more than the flatness of one surface. It is influenced by:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Front-surface form<\/li>\n\n\n\n<li>Rear-surface form<\/li>\n\n\n\n<li>Brechungsindex<\/li>\n\n\n\n<li>Dickenabweichung<\/li>\n\n\n\n<li>Parallelit\u00e4t<\/li>\n\n\n\n<li>Materialhomogenit\u00e4t<\/li>\n\n\n\n<li>Kristallorientierung<\/li>\n\n\n\n<li>Zunehmender Stress<\/li>\n<\/ul>\n\n\n\n<p class=\"wp-block-paragraph\">For this reason, transmitted wavefront error may be a more meaningful specification than individual surface flatness in some precision systems.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">A component can have two relatively flat surfaces but still produce optical distortion if the surfaces, thickness distribution or internal refractive-index distribution interact unfavorably.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\">11. Parallelism: The Relationship Between Two Surfaces<\/h2>\n\n\n\n<p class=\"wp-block-paragraph\">Parallelism describes how closely the front and rear surfaces of a sapphire window remain parallel to each other.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Es kann wie folgt angegeben werden:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Winkelabweichung<\/li>\n\n\n\n<li>Keilwinkel<\/li>\n\n\n\n<li>Dickenabweichung<\/li>\n\n\n\n<li>Gesamtdickenabweichung<\/li>\n\n\n\n<li>Bogenminuten<\/li>\n\n\n\n<li>Bogensekunden<\/li>\n\n\n\n<li>Milliradian<\/li>\n\n\n\n<li>Mikroradian<\/li>\n<\/ul>\n\n\n\n<p class=\"wp-block-paragraph\">A perfectly parallel window has zero wedge angle. In practice, every manufactured window has some finite deviation.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">For general protective windows, a relatively loose parallelism tolerance may be acceptable. Precision laser, imaging and interferometric systems may require parallelism controlled to a few arcseconds or less.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\">12. Why Parallelism Matters<\/h2>\n\n\n\n<p class=\"wp-block-paragraph\">When a light beam passes through a plane-parallel window at an angle, it experiences lateral displacement. If the two surfaces are not parallel, the window behaves like a weak prism and introduces angular beam deviation.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">This can cause:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Beam pointing error<\/li>\n\n\n\n<li>Bildverschiebung<\/li>\n\n\n\n<li>Alignment changes<\/li>\n\n\n\n<li>Focus shift across the aperture<\/li>\n\n\n\n<li>Chromatic angular deviation<\/li>\n\n\n\n<li>Ungleichm\u00e4\u00dfige optische Wegl\u00e4nge<\/li>\n\n\n\n<li>Difficulty replacing windows interchangeably<\/li>\n<\/ul>\n\n\n\n<p class=\"wp-block-paragraph\">In a laser system, even a small angular error may become significant over a long propagation distance. A small beam deviation at the window can produce a much larger positional shift several metres away.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Parallelism is also important in imaging systems because wedge can create double images or ghost displacement caused by reflections from the two surfaces.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\">13. Parallel Windows and Unwanted Interference<\/h2>\n\n\n\n<p class=\"wp-block-paragraph\">Although high parallelism is desirable in many applications, extremely parallel surfaces can also form a weak Fabry\u2013P\u00e9rot etalon.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Multiple reflections between the two surfaces may interfere and produce:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Spectral fringes<\/li>\n\n\n\n<li>Intensity modulation<\/li>\n\n\n\n<li>Etalon effects<\/li>\n\n\n\n<li>Interference rings<\/li>\n\n\n\n<li>Measurement instability<\/li>\n<\/ul>\n\n\n\n<p class=\"wp-block-paragraph\">For broadband imaging, these effects may be negligible. For narrow-linewidth lasers, spectroscopy or interferometric systems, they may become significant.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">In such cases, designers may intentionally specify a small wedge rather than maximum parallelism. The wedge separates reflected beams and prevents them from overlapping coherently.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Therefore, the correct engineering requirement is not always \u201cthe highest possible parallelism.\u201d It is the surface relationship that best suits the optical system.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\">14. How Parallelism Is Measured<\/h2>\n\n\n\n<p class=\"wp-block-paragraph\">Parallelism may be evaluated using several methods.<\/p>\n\n\n\n<h3 class=\"wp-block-heading\">Mechanical Thickness Measurement<\/h3>\n\n\n\n<p class=\"wp-block-paragraph\">A precision thickness gauge or coordinate measurement system can measure thickness at multiple positions. The difference between maximum and minimum values provides total thickness variation.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">This method is useful for manufacturing control, but it does not always provide the complete angular relationship between optical surfaces.<\/p>\n\n\n\n<h3 class=\"wp-block-heading\">Interferometric Measurement<\/h3>\n\n\n\n<p class=\"wp-block-paragraph\">Interferometry can evaluate the relative geometry of the front and rear surfaces with high precision.<\/p>\n\n\n\n<h3 class=\"wp-block-heading\">Autocollimator Measurement<\/h3>\n\n\n\n<p class=\"wp-block-paragraph\">Reflections from the two surfaces can be observed with an autocollimator. The angular separation between the reflected images can be used to determine wedge or parallelism.<\/p>\n\n\n\n<h3 class=\"wp-block-heading\">Optical Beam-Deviation Measurement<\/h3>\n\n\n\n<p class=\"wp-block-paragraph\">A collimated beam passes through the window, and the change in beam angle or position is measured. This method directly evaluates the effect of the component on the optical path.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">The selected method should match the tolerance level and functional requirements of the application.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\">15. Flatness and Parallelism Are Not the Same<\/h2>\n\n\n\n<p class=\"wp-block-paragraph\">Flatness and parallelism are related but independent.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">A window may have:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Two flat surfaces that are not parallel<\/li>\n\n\n\n<li>Two parallel surfaces that are both curved<\/li>\n\n\n\n<li>One flat surface and one distorted surface<\/li>\n\n\n\n<li>Good individual surface flatness but unacceptable transmitted wavefront error<\/li>\n<\/ul>\n\n\n\n<p class=\"wp-block-paragraph\">Consider a wedge-shaped window. Both surfaces could be polished extremely flat, but because they are tilted relative to each other, the parallelism would be poor.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Conversely, two surfaces could have similar curvature and remain approximately parallel at every point. The parallelism may appear acceptable even though neither surface meets a strict flatness requirement.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Both parameters must therefore be specified separately when they are functionally important.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\">16. Typical Specification Levels for Sapphire Windows<\/h2>\n\n\n\n<p class=\"wp-block-paragraph\">The following values provide a general engineering reference rather than universal acceptance criteria.<\/p>\n\n\n\n<figure class=\"wp-block-table\"><table class=\"has-fixed-layout\"><tbody><tr><td>Application Level<\/td><td>Scratch-Dig<\/td><td>Ebenheit<\/td><td>Parallelit\u00e4t<\/td><\/tr><tr><td>Allgemeines Schutzfenster<\/td><td>80 zu 50 oder 60 zu 40<\/td><td>2\u03bb to 1\u03bb<\/td><td>Several arcminutes<\/td><\/tr><tr><td>Industrial optical window<\/td><td>60-40<\/td><td>1\u03bb to \u03bb\/2<\/td><td>1\u20133 arcminutes<\/td><\/tr><tr><td>Pr\u00e4zisions-Bildgebungsfenster<\/td><td>40-20<\/td><td>\u03bb\/2 to \u03bb\/4<\/td><td>Less than 1 arcminute<\/td><\/tr><tr><td>Laser-grade window<\/td><td>20:10 oder besser<\/td><td>\u03bb\/4 to \u03bb\/10<\/td><td>Arcsecond-level control<\/td><\/tr><tr><td>Interferometric application<\/td><td>Application-specific<\/td><td>\u03bb\/10 or tighter<\/td><td>Application-specific<\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\n<p class=\"wp-block-paragraph\">The appropriate specification depends on diameter, thickness, aspect ratio, clear aperture, crystal orientation, coating condition and inspection method.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Large, thin sapphire windows are generally more difficult to manufacture and measure to extremely tight flatness tolerances than small, thick windows.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\">17. Avoiding Over-Specification<\/h2>\n\n\n\n<p class=\"wp-block-paragraph\">One of the most common procurement mistakes is requesting the strictest available values for every parameter.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">For example, a buyer may specify:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>10-5 scratch-dig<\/li>\n\n\n\n<li>\u03bb\/10 flatness<\/li>\n\n\n\n<li>A few arcseconds of parallelism<\/li>\n\n\n\n<li>Extrem geringe Oberfl\u00e4chenrauheit<\/li>\n\n\n\n<li>Full-aperture inspection<\/li>\n\n\n\n<li>Tight dimensional tolerances<\/li>\n<\/ul>\n\n\n\n<p class=\"wp-block-paragraph\">Such a window may be technically possible, but it can require additional polishing, interferometric correction, specialized handling, more extensive inspection and a lower manufacturing yield.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">As a result, cost and lead time may increase substantially without providing a meaningful performance benefit.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">A better specification process begins with the optical function:<\/p>\n\n\n\n<ol start=\"1\" class=\"wp-block-list\">\n<li>Determine the wavelength range.<\/li>\n\n\n\n<li>Define the clear aperture.<\/li>\n\n\n\n<li>Evaluate whether the window is used for protection, imaging, laser transmission or metrology.<\/li>\n\n\n\n<li>Calculate the allowable beam deviation or wavefront error.<\/li>\n\n\n\n<li>Determine whether stray light is critical.<\/li>\n\n\n\n<li>Consider whether a deliberate wedge is needed.<\/li>\n\n\n\n<li>Select only the tolerances required by the system.<\/li>\n<\/ol>\n\n\n\n<h2 class=\"wp-block-heading\">18. Important Information to Include on a Sapphire Window Drawing<\/h2>\n\n\n\n<p class=\"wp-block-paragraph\">A complete technical drawing or request for quotation should include more than the basic diameter and thickness.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Recommended information includes:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Outside dimensions<\/li>\n\n\n\n<li>Nominal thickness<\/li>\n\n\n\n<li>Dickentoleranz<\/li>\n\n\n\n<li>Sapphire crystal orientation<\/li>\n\n\n\n<li>Lichtdurchlass<\/li>\n\n\n\n<li>Anforderung an das Aufkratzen<\/li>\n\n\n\n<li>Applicable surface-imperfection standard<\/li>\n\n\n\n<li>Anforderung an die Ebenheit<\/li>\n\n\n\n<li>Reference wavelength<\/li>\n\n\n\n<li>Parallelit\u00e4t oder Keiltoleranz<\/li>\n\n\n\n<li>Oberfl\u00e4chenrauheit<\/li>\n\n\n\n<li>Kantenfasung oder Abschr\u00e4gung<\/li>\n\n\n\n<li>Edge-chip allowance<\/li>\n\n\n\n<li>Beschichtungsart<\/li>\n\n\n\n<li>Coating aperture<\/li>\n\n\n\n<li>Transmission wavelength range<\/li>\n\n\n\n<li>Umweltanforderungen<\/li>\n\n\n\n<li>Inspection and documentation requirements<\/li>\n<\/ul>\n\n\n\n<p class=\"wp-block-paragraph\">The drawing should also state whether flatness and surface quality apply to both surfaces or only to the optical working surface.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\">19. Selecting Specifications by Application<\/h2>\n\n\n\n<h3 class=\"wp-block-heading\">Protective Sensor Covers<\/h3>\n\n\n\n<p class=\"wp-block-paragraph\">For protective covers used on industrial sensors, cameras or detectors, mechanical strength and durability may be more important than extremely tight optical tolerances.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">A 60-40 or 80-50 surface-quality requirement and moderate flatness may be sufficient, depending on image resolution and aperture position.<\/p>\n\n\n\n<h3 class=\"wp-block-heading\">High-Resolution Imaging<\/h3>\n\n\n\n<p class=\"wp-block-paragraph\">Imaging systems require better control of surface form and parallelism because wavefront distortion and wedge can reduce image quality.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Specifications such as 40-20 scratch-dig and \u03bb\/4 or \u03bb\/2 flatness may be appropriate, but transmitted wavefront error should also be considered.<\/p>\n\n\n\n<h3 class=\"wp-block-heading\">Laser-Fenster<\/h3>\n\n\n\n<p class=\"wp-block-paragraph\">Laser applications often require strict scratch-dig, low surface roughness, suitable coating quality and controlled flatness.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">The designer should also evaluate whether the surfaces should be parallel or intentionally wedged.<\/p>\n\n\n\n<h3 class=\"wp-block-heading\">Vacuum and High-Pressure Viewports<\/h3>\n\n\n\n<p class=\"wp-block-paragraph\">Mechanical thickness and mounting design are primary considerations, but optical quality remains important when the viewport is used for observation, spectroscopy or laser access.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Flatness should be evaluated under realistic mounting and pressure conditions when deformation may affect optical performance.<\/p>\n\n\n\n<h3 class=\"wp-block-heading\">Halbleiterfertigungsanlagen<\/h3>\n\n\n\n<p class=\"wp-block-paragraph\">Sapphire windows used in plasma, deposition, etching or inspection equipment may require a combination of optical quality, dimensional precision, cleanliness and resistance to chemical or plasma exposure.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">The clear aperture, coating durability and allowable particle generation should be defined together with the optical tolerances.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\">20. Conclusion<\/h2>\n\n\n\n<p class=\"wp-block-paragraph\">Scratch-dig, flatness and parallelism describe three different aspects of sapphire window quality.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Scratch-dig controls localized imperfections such as scratches and pits. Flatness controls the deviation of each optical surface from an ideal plane. Parallelism controls the angular relationship between the front and rear surfaces.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">None of these parameters should be evaluated in isolation.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">A high-performance sapphire window requires a balanced specification that considers:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Oberfl\u00e4chenfehler<\/li>\n\n\n\n<li>Surface form<\/li>\n\n\n\n<li>Oberfl\u00e4chenrauheit<\/li>\n\n\n\n<li>Dickenabweichung<\/li>\n\n\n\n<li>Keil<\/li>\n\n\n\n<li>Fehler der \u00fcbertragenen Wellenfront<\/li>\n\n\n\n<li>Beschichtungsleistung<\/li>\n\n\n\n<li>Mounting conditions<\/li>\n\n\n\n<li>Optical wavelength<\/li>\n\n\n\n<li>Final application<\/li>\n<\/ul>\n\n\n\n<p class=\"wp-block-paragraph\">The best sapphire window is not necessarily the one with the strictest numerical tolerances. It is the one whose optical, mechanical and dimensional requirements are correctly matched to the operating system.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">By defining the applicable standard, clear aperture, measurement method and functional limits, engineers can reduce procurement ambiguity, avoid unnecessary manufacturing costs and obtain sapphire windows that provide reliable optical performance in real operating conditions.<\/p>","protected":false},"excerpt":{"rendered":"<p>Sapphire windows are widely used in optical instruments, semiconductor processing equipment, high-pressure viewports, infrared systems, protective sensor covers and harsh-environment imaging systems. Their popularity comes from sapphire\u2019s high hardness, mechanical strength, chemical stability and broad optical transmission range. However, the performance of a sapphire window is not determined by the material alone. Two windows made [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":2670,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"site-sidebar-layout":"default","site-content-layout":"","ast-site-content-layout":"default","site-content-style":"default","site-sidebar-style":"default","ast-global-header-display":"","ast-banner-title-visibility":"","ast-main-header-display":"","ast-hfb-above-header-display":"","ast-hfb-below-header-display":"","ast-hfb-mobile-header-display":"","site-post-title":"","ast-breadcrumbs-content":"","ast-featured-img":"","footer-sml-layout":"","ast-disable-related-posts":"","theme-transparent-header-meta":"","adv-header-id-meta":"","stick-header-meta":"","header-above-stick-meta":"","header-main-stick-meta":"","header-below-stick-meta":"","astra-migrate-meta-layouts":"default","ast-page-background-enabled":"default","ast-page-background-meta":{"desktop":{"background-color":"","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""},"tablet":{"background-color":"","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""},"mobile":{"background-color":"","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""}},"ast-content-background-meta":{"desktop":{"background-color":"var(--ast-global-color-5)","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""},"tablet":{"background-color":"var(--ast-global-color-5)","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""},"mobile":{"background-color":"var(--ast-global-color-5)","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""}},"footnotes":""},"categories":[17],"tags":[1049,1047,933,1050,931,152,1048,264,606,164,54,1045,1046,282,245,930,1051],"class_list":["post-2669","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-industry-news","tag-iso-10110","tag-mil-prf-13830","tag-optical-flatness","tag-optical-parallelism","tag-optical-polishing","tag-optical-sapphire-window","tag-parallelism","tag-precision-optics","tag-sapphire-glass-window","tag-sapphire-optical-window","tag-sapphire-window","tag-scratch-dig-2","tag-scratch-dig-standard","tag-surface-flatness","tag-surface-quality","tag-surface-roughness","tag-wavefront-error"],"_links":{"self":[{"href":"https:\/\/www.sapphire-windows.com\/de\/wp-json\/wp\/v2\/posts\/2669","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.sapphire-windows.com\/de\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.sapphire-windows.com\/de\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.sapphire-windows.com\/de\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.sapphire-windows.com\/de\/wp-json\/wp\/v2\/comments?post=2669"}],"version-history":[{"count":1,"href":"https:\/\/www.sapphire-windows.com\/de\/wp-json\/wp\/v2\/posts\/2669\/revisions"}],"predecessor-version":[{"id":2671,"href":"https:\/\/www.sapphire-windows.com\/de\/wp-json\/wp\/v2\/posts\/2669\/revisions\/2671"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.sapphire-windows.com\/de\/wp-json\/wp\/v2\/media\/2670"}],"wp:attachment":[{"href":"https:\/\/www.sapphire-windows.com\/de\/wp-json\/wp\/v2\/media?parent=2669"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.sapphire-windows.com\/de\/wp-json\/wp\/v2\/categories?post=2669"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.sapphire-windows.com\/de\/wp-json\/wp\/v2\/tags?post=2669"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}